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Beam damage of single semiconductor nanowires during X-ray nanobeam diffraction experiments |
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Titel: |
Beam damage of single semiconductor nanowires during X-ray nanobeam diffraction experiments |
Auteur: |
Al Hassan, Ali Lähnemann, Jonas Davtyan, Arman Al-Humaidi, Mahmoud Herranz, Jesús Bahrami, Danial Anjum, Taseer Bertram, Florian Dey, Arka Bikash Geelhaar, Lutz Pietsch, Ullrich |
Verschenen in: |
Journal of synchrotron radiation |
Paginering: |
Jaargang 27 () nr. 5 pagina's 1200-1208 |
Jaar: |
2020-09-01 |
Inhoud: |
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Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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