High accuracy determination of photoelectric cross sections, X-ray absorption fine structure and nanostructure analysis of zinc selenide using the X-ray extended range technique
Titel:
High accuracy determination of photoelectric cross sections, X-ray absorption fine structure and nanostructure analysis of zinc selenide using the X-ray extended range technique
Auteur:
Sier, Daniel Cousland, Geoffrey P. Trevorah, Ryan M. Ekanayake, Ruwini S. K. Tran, Chanh Q. Hester, James R. Chantler, Christopher T.
Verschenen in:
Journal of synchrotron radiation
Paginering:
Jaargang 27 () nr. 5 pagina's 1262-1277
Jaar:
2020-09-01
Inhoud:
Uitgever:
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England