Soft X-ray diffraction patterns measured by a LiF detector with sub-micrometre resolution and an ultimate dynamic range
Titel:
Soft X-ray diffraction patterns measured by a LiF detector with sub-micrometre resolution and an ultimate dynamic range
Auteur:
Makarov, Sergey Pikuz, Sergey Ryazantsev, Sergey Pikuz, Tatiana Buzmakov, Alexey Rose, Max Lazarev, Sergey Senkbeil, Tobias von Gundlach, Andreas Stuhr, Susan Rumancev, Christoph Dzhigaev, Dmitry Skopintsev, Petr Zaluzhnyy, Ivan Viefhaus, Jens Rosenhahn, Axel Kodama, Ryosuke Vartanyants, Ivan A.
Verschenen in:
Journal of synchrotron radiation
Paginering:
Jaargang 27 () nr. 3 pagina's 625-632
Jaar:
2020-05-01
Inhoud:
Uitgever:
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England