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Microsecond time-resolved X-ray diffraction for the investigation of fatigue behavior during ultrasonic fatigue loading |
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Titel: |
Microsecond time-resolved X-ray diffraction for the investigation of fatigue behavior during ultrasonic fatigue loading |
Auteur: |
Ors, T. Ranc, N. Pelerin, M. Michel, V. Favier, V. Castelnau, O. Mocuta, C. Thiaudière, D. |
Verschenen in: |
Journal of synchrotron radiation |
Paginering: |
Jaargang 26 (2019) nr. 5 pagina's 1660-1670 |
Jaar: |
2019-09-01 |
Inhoud: |
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Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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