Implications of X-ray beam profiles on qualitative and quantitative synchrotron micro-focus X-ray fluorescence microscopy
Titel:
Implications of X-ray beam profiles on qualitative and quantitative synchrotron micro-focus X-ray fluorescence microscopy
Auteur:
Morrell, Alexander P. Mosselmans, J. Frederick W. Geraki, Kalotina Ignatyev, Konstantin Castillo-Michel, Hiram Monksfield, Peter Warfield, Adrian T. Febbraio, Maria Roberts, Helen M. Addison, Owen Martin, Richard A.
Verschenen in:
Journal of synchrotron radiation
Paginering:
Jaargang 25 (2018) nr. 6 pagina's 1719-1726
Jaar:
2018-01-01
Inhoud:
Uitgever:
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England