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Thickness-dependent structural characteristics for a sputtering-deposited chromium monolayer and Cr/C and Cr/Sc multilayers |
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Titel: |
Thickness-dependent structural characteristics for a sputtering-deposited chromium monolayer and Cr/C and Cr/Sc multilayers |
Auteur: |
Jiang, Hui Wang, Hua Zhu, Jingtao Xue, Chaofan Zhang, Jiayi Tian, Naxi Li, Aiguo |
Verschenen in: |
Journal of synchrotron radiation |
Paginering: |
Jaargang 25 (2018) nr. 3 pagina's 785-792 |
Jaar: |
2018-05-01 |
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Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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