The EIGER detector for low-energy electron microscopy and photoemission electron microscopy
Titel:
The EIGER detector for low-energy electron microscopy and photoemission electron microscopy
Auteur:
Tinti, G. Marchetto, H. Vaz, C. A. F. Kleibert, A. Andrä, M. Barten, R. Bergamaschi, A. Brückner, M. Cartier, S. Dinapoli, R. Franz, T. Fröjdh, E. Greiffenberg, D. Lopez-Cuenca, C. Mezza, D. Mozzanica, A. Nolting, F. Ramilli, M. Redford, S. Ruat, M. Ruder, Ch. Schädler, L. Schmidt, Th. Schmitt, B. Schütz, F. Shi, X. Thattil, D. Vetter, S. Zhang, J.
Verschenen in:
Journal of synchrotron radiation
Paginering:
Jaargang 24 (2017) nr. 5 pagina's 963-974
Jaar:
2017-09-01
Inhoud:
Uitgever:
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England