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                                       Details for article 14 of 28 found articles
 
 
  Investigation of nanoparticulate silicon as printed layers using scanning electron microscopy, transmission electron microscopy, X-ray absorption spectroscopy and X-ray photoelectron spectroscopy
 
 
Title: Investigation of nanoparticulate silicon as printed layers using scanning electron microscopy, transmission electron microscopy, X-ray absorption spectroscopy and X-ray photoelectron spectroscopy
Author: Unuigbe, David M.
Harting, Margit
Jonah, Emmanuel O.
Britton, David T.
Nordlund, Dennis
Appeared in: Journal of synchrotron radiation
Paging: Volume 24 (2017) nr. 5 pages 1017-1023
Year: 2017-09-01
Contents:
Publisher: International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 14 of 28 found articles
 
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