Investigation of nanoparticulate silicon as printed layers using scanning electron microscopy, transmission electron microscopy, X-ray absorption spectroscopy and X-ray photoelectron spectroscopy
Title:
Investigation of nanoparticulate silicon as printed layers using scanning electron microscopy, transmission electron microscopy, X-ray absorption spectroscopy and X-ray photoelectron spectroscopy
Author:
Unuigbe, David M. Harting, Margit Jonah, Emmanuel O. Britton, David T. Nordlund, Dennis
Appeared in:
Journal of synchrotron radiation
Paging:
Volume 24 (2017) nr. 5 pages 1017-1023
Year:
2017-09-01
Contents:
Publisher:
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England