Simultaneous X-ray fluorescence and scanning X-ray diffraction microscopy at the Australian Synchrotron XFM beamline
Titel:
Simultaneous X-ray fluorescence and scanning X-ray diffraction microscopy at the Australian Synchrotron XFM beamline
Auteur:
Jones, Michael W. M. Phillips, Nicholas W. van Riessen, Grant A. Abbey, Brian Vine, David J. Nashed, Youssef S. G. Mudie, Stephen T. Afshar, Nader Kirkham, Robin Chen, Bo Balaur, Eugeniu de Jonge, Martin D.
Verschenen in:
Journal of synchrotron radiation
Paginering:
Jaargang 23 (2016) nr. 5 pagina's 1151-1157
Jaar:
2016-09-01
Inhoud:
Uitgever:
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England