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Multiple scattering in grazing-incidence X-ray diffraction: impact on lattice-constant determination in thin films |
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Titel: |
Multiple scattering in grazing-incidence X-ray diffraction: impact on lattice-constant determination in thin films |
Auteur: |
Resel, Roland Bainschab, Markus Pichler, Alexander Dingemans, Theo Simbrunner, Clemens Stangl, Julian Salzmann, Ingo |
Verschenen in: |
Journal of synchrotron radiation |
Paginering: |
Jaargang 23 (2016) nr. 3 pagina's 729-734 |
Jaar: |
2016-05-01 |
Inhoud: |
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Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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