X-ray spectroscopy for chemistry in the 2-4 keV energy regime at the XMaS beamline: ionic liquids, Rh and Pd catalysts in gas and liquid environments, and Cl contamination in γ-Al2O3
Titel:
X-ray spectroscopy for chemistry in the 2-4 keV energy regime at the XMaS beamline: ionic liquids, Rh and Pd catalysts in gas and liquid environments, and Cl contamination in γ-Al2O3
Auteur:
Thompson, Paul B. J. Nguyen, Bao N. Nicholls, Rachel Bourne, Richard A. Brazier, John B. Lovelock, Kevin R. J. Brown, Simon D. Wermeille, Didier Bikondoa, Oier Lucas, Christopher A. Hase, Thomas P. A. Newton, Mark A.
Verschenen in:
Journal of synchrotron radiation
Paginering:
Jaargang 22 (2015) nr. 6 pagina's 1426-1439
Jaar:
2015-01-01
Inhoud:
Uitgever:
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England