High-resolution X-ray emission spectroscopy with transition-edge sensors: present performance and future potential
Titel:
High-resolution X-ray emission spectroscopy with transition-edge sensors: present performance and future potential
Auteur:
Uhlig, J. Doriese, W. B. Fowler, J. W. Swetz, D. S. Jaye, C. Fischer, D. A. Reintsema, C. D. Bennett, D. A. Vale, L. R. Mandal, U. O'Neil, G. C. Miaja-Avila, L. Joe, Y. I. El Nahhas, A. Fullagar, W. Parnefjord Gustafsson, F. Sundström, V. Kurunthu, D. Hilton, G. C. Schmidt, D. R. Ullom, J. N.
Verschenen in:
Journal of synchrotron radiation
Paginering:
Jaargang 22 (2015) nr. 3 pagina's 766-775
Jaar:
2015-05-01
Inhoud:
Uitgever:
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England