Scanning force microscope for in situ nanofocused X-ray diffraction studies
Titel:
Scanning force microscope for in situ nanofocused X-ray diffraction studies
Auteur:
Ren, Zhe Mastropietro, Francesca Davydok, Anton Langlais, Simon Richard, Marie-Ingrid Furter, Jean-Jacques Thomas, Olivier Dupraz, Maxime Verdier, Marc Beutier, Guillaume Boesecke, Peter Cornelius, Thomas W.
Verschenen in:
Journal of synchrotron radiation
Paginering:
Jaargang 21 (2014) nr. 5 pagina's 1128-1133
Jaar:
2014-09-01
Inhoud:
Uitgever:
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England