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X-ray absorption near-edge structure anomalous behaviour in structures with buried layers containing silicon nanocrystals |
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Titel: |
X-ray absorption near-edge structure anomalous behaviour in structures with buried layers containing silicon nanocrystals |
Auteur: |
Terekhov, V. A. Tetelbaum, D. I. Spirin, D. E. Pankov, K. N. Mikhailov, A. N. Belov, A. I. Ershov, A. V. Turishchev, S. Yu. |
Verschenen in: |
Journal of synchrotron radiation |
Paginering: |
Jaargang 21 (2014) nr. 1 pagina's 209-214 |
Jaar: |
2014-01-01 |
Inhoud: |
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Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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