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Integration method for directly analyzing interface statistics of periodic multilayers from X-ray scattering |
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Titel: |
Integration method for directly analyzing interface statistics of periodic multilayers from X-ray scattering |
Auteur: |
Li, Haochuan Zhu, Jingtao Wang, Zhanshan Chen, Hong Wang, Yuzhu Wang, Jie |
Verschenen in: |
Journal of synchrotron radiation |
Paginering: |
Jaargang 21 (2014) nr. 1 pagina's 97-103 |
Jaar: |
2014-01-01 |
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Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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