|
Versatility of a hard X-ray Kirkpatrick–Baez focus characterized by ptychography |
|
|
|
Titel: |
Versatility of a hard X-ray Kirkpatrick–Baez focus characterized by ptychography |
Auteur: |
Giewekemeyer, Klaus Wilke, Robin N. Osterhoff, Markus Bartels, Matthias Kalbfleisch, Sebastian Salditt, Tim |
Verschenen in: |
Journal of synchrotron radiation |
Paginering: |
Jaargang 20 (2013) nr. 3 pagina's 490-497 |
Jaar: |
2013-05-01 |
Inhoud: |
|
Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
|
|
|
|