A 30 nm-resolution hard X-ray microscope with X-ray fluorescence mapping capability at BSRF
Titel:
A 30 nm-resolution hard X-ray microscope with X-ray fluorescence mapping capability at BSRF
Auteur:
Yuan, Qingxi Zhang, Kai Hong, Youli Huang, Wanxia Gao, Kun Wang, Zhili Zhu, Peiping Gelb, Jeff Tkachuk, Andrei Hornberger, Benjamin Feser, Michael Yun, Wenbing Wu, Ziyu
Verschenen in:
Journal of synchrotron radiation
Paginering:
Jaargang 19 (2012) nr. 6 pagina's 1021-1028
Jaar:
2012-01-01
Inhoud:
Uitgever:
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England