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Journal description
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Details for article 10 of 32 found articles
| Title: |
Complete polarization analysis of an APPLE II undulator using a soft X-ray polarimeter |
| Author: |
Wang, Hongchang Bencok, Peter Steadman, Paul Longhi, Emily Zhu, Jingtao Wang, Zhanshan |
| Appeared in: |
Journal of synchrotron radiation |
| Paging: | Volume 19 (2012) nr. 6 pages 944-948 |
| Year: |
2012-01-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 32 found articles
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