Synchrotron X-ray tests of an L-shaped laterally graded multilayer mirror for the analyzer system of the ultra-high-resolution IXS spectrometer at NSLS-II
Title:
Synchrotron X-ray tests of an L-shaped laterally graded multilayer mirror for the analyzer system of the ultra-high-resolution IXS spectrometer at NSLS-II
Author:
Honnicke, Marcelo G. Keister, Jeffrey W. Conley, Raymond Kaznatcheev, Konstantine Takacs, Peter Z. Coburn, David Scott Reffi, Leo Cai, Yong Q.
Appeared in:
Journal of synchrotron radiation
Paging:
Volume 18 (2011) nr. 6 pages 862-870
Year:
2011-01-01
Contents:
Publisher:
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England