Synchrotron X-ray tests of an L-shaped laterally graded multilayer mirror for the analyzer system of the ultra-high-resolution IXS spectrometer at NSLS-II
Titel:
Synchrotron X-ray tests of an L-shaped laterally graded multilayer mirror for the analyzer system of the ultra-high-resolution IXS spectrometer at NSLS-II
Auteur:
Honnicke, Marcelo G. Keister, Jeffrey W. Conley, Raymond Kaznatcheev, Konstantine Takacs, Peter Z. Coburn, David Scott Reffi, Leo Cai, Yong Q.
Verschenen in:
Journal of synchrotron radiation
Paginering:
Jaargang 18 (2011) nr. 6 pagina's 862-870
Jaar:
2011-01-01
Inhoud:
Uitgever:
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England