|
Carbon contamination of soft X-ray beamlines: dramatic anti-reflection coating effects observed in the 1 keV photon energy region |
|
|
|
Titel: |
Carbon contamination of soft X-ray beamlines: dramatic anti-reflection coating effects observed in the 1 keV photon energy region |
Auteur: |
Chauvet, C. Polack, F. Silly, M. G. Lagarde, B. Thomasset, M. Kubsky, S. Duval, J. P. Risterucci, P. Pilette, B. Yao, I. Bergeard, N. Sirotti, F. |
Verschenen in: |
Journal of synchrotron radiation |
Paginering: |
Jaargang 18 (2011) nr. 5 pagina's 761-764 |
Jaar: |
2011-09-01 |
Inhoud: |
|
Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
|
|
|
|