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Journal description
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Details for article 18 of 19 found articles
| Title: |
X-ray diffractometry and topography of lattice plane curvature in thermally deformed Si wafer |
| Author: |
Yi, J. M. Chu, Y. S. Argunova, T. S. Domagala, J. Z. Je, J. H. |
| Appeared in: |
Journal of synchrotron radiation |
| Paging: | Volume 15 (2008) nr. 1 pages 96-99 |
| Year: |
2008-01-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 18 of 19 found articles
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