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X-ray beam-position monitoring in the sub-micrometre and sub-second regime |
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Title: |
X-ray beam-position monitoring in the sub-micrometre and sub-second regime |
Author: |
Bunk, Oliver Pfeiffer, Franz Stampanoni, Marco Patterson, Bruce D. Schulze-Briese, Clemens David, Christian |
Appeared in: |
Journal of synchrotron radiation |
Paging: |
Volume 12 (2005) nr. 6 pages 795-799 |
Year: |
2005-01-01 |
Contents: |
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Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Source file: |
Elektronische Wetenschappelijke Tijdschriften |
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