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                                       Details for article 19 of 19 found articles
 
 
  Three-wave X-ray diffraction: an analysis scheme of the sensitivity in determining triplet phase invariants
 
 
Title: Three-wave X-ray diffraction: an analysis scheme of the sensitivity in determining triplet phase invariants
Author: Stetsko, Yuri P.
Chang, Shih-Lin
Appeared in: Acta crystallographica. Section A, Foundations of crystallography
Paging: Volume 55 (1999) nr. 4 pages 683-694
Year: 1999-07-01
Contents:
Publisher: International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 19 of 19 found articles
 
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