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Journal description
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Details for article 8 of 23 found articles
| Title: |
Detection of a Point Defect in a Silicon Single Crystal by a Subtraction Method using High-Resolution Transmission Electron Microscopy |
| Author: |
Awaji, M. Hashimoto, H. |
| Appeared in: |
Acta crystallographica. Section A, Foundations of crystallography |
| Paging: | Volume 52 (1996) nr. 2 pages 158-170 |
| Year: |
1996-03-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 23 found articles
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