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Determination of anomalous scattering factors from X-ray resonant-scattering-induced Pendellösung fringes: Ge |
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Titel: |
Determination of anomalous scattering factors from X-ray resonant-scattering-induced Pendellösung fringes: Ge |
Auteur: |
Fukamachi, T. Yoshizawa, M. Ehara, K. Kawamura, T. Nakajima, T. |
Verschenen in: |
Acta crystallographica. Section A, Foundations of crystallography |
Paginering: |
Jaargang 46 (1990) nr. 12 pagina's 945-948 |
Jaar: |
1990-02-01 |
Inhoud: |
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Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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