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Journal description
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Details for article 52 of 56 found articles
| Title: |
Two-beam features in electron diffraction patterns – application to refinement of low-order structure factors in GaAs |
| Author: |
Gjønnes, K. Gjønnes, J. Zuo, J. Spence, J. C. H. |
| Appeared in: |
Acta crystallographica. Section A, Foundations of crystallography |
| Paging: | Volume 44 (1988) nr. 6 pages 810-820 |
| Year: |
1988-01-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 52 of 56 found articles
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