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Details for article 20 of 28 found articles
| Title: |
Resolution analyses for Mössbauer diffraction: resolved TDS profiles in silicon |
| Author: |
Crow, M. L. Schupp, G. Yelon, W. B. Mullen, J. G. Djedid, A. |
| Appeared in: |
Acta crystallographica. Section A, Foundations of crystallography |
| Paging: | Volume 43 (1987) nr. 5 pages 638-645 |
| Year: |
1987-09-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 20 of 28 found articles
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