|
| next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 1 of 20 found articles
| Title: |
Absolute structure-factor measurements in imperfect single crystals by means of γ-ray diffractometry |
| Author: |
Schneider, J. R. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 9 (1976) nr. 5 pages 394-402 |
| Year: |
1976-00-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 20 found articles
| next >> |