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Lattice-parameter measurement technique for single crystals using two lattice planes, and its application to Gd3Ga5O12 single crystals |
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Titel: |
Lattice-parameter measurement technique for single crystals using two lattice planes, and its application to Gd3Ga5O12 single crystals |
Auteur: |
Isomae, S. Kishino, S. Takagi, K. Ishii, M. Maki, M. |
Verschenen in: |
Journal of applied crystallography |
Paginering: |
Jaargang 9 (1976) nr. 4 pagina's 342-346 |
Jaar: |
1976-08-01 |
Inhoud: |
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Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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