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Journal description
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Details for article 3 of 24 found articles
| Title: |
Accurate lattice constants from multiple reflection measurements. II. Lattice constants of germanium silicon, and diamond |
| Author: |
Hom, T. Kiszenik, W. Post, B. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 8 (1975) nr. 4 pages 457-458 |
| Year: |
1975-08-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 24 found articles
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