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Journal description
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Details for article 7 of 28 found articles
| Title: |
Computer simulation of X-ray topographs of stacking faults in silicon |
| Author: |
Wonsiewicz, B. C. Patel, J. R. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 8 (1975) nr. 1 pages 67-68 |
| Year: |
1975-02-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 28 found articles
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