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Polarized X-ray diffraction anomalous near-edge structure study on the orbital physics of thin WSe2 layers |
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Titel: |
Polarized X-ray diffraction anomalous near-edge structure study on the orbital physics of thin WSe2 layers |
Auteur: |
Chen, Shih-Lun Wu, Tai-Sing Huang, Hung-Lung Chen, Sheng-Fu Soo, Yun-Liang Jeng, Horng-Tay Hung, Hsueh-Hsing |
Verschenen in: |
Journal of applied crystallography |
Paginering: |
Jaargang 57 () nr. 2 pagina's 344-350 |
Jaar: |
2024-04-01 |
Inhoud: |
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Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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