X-ray scattering study of GaN nanowires grown on Ti/Al2O3 by molecular beam epitaxy
Titel:
X-ray scattering study of GaN nanowires grown on Ti/Al2O3 by molecular beam epitaxy
Auteur:
Kaganer, Vladimir M. Konovalov, Oleg V. Calabrese, Gabriele van Treeck, David Kwasniewski, Albert Richter, Carsten Fernández-Garrido, Sergio Brandt, Oliver
Verschenen in:
Journal of applied crystallography
Paginering:
Jaargang 56 () nr. 2 pagina's 439-448
Jaar:
2023-04-01
Inhoud:
Uitgever:
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England