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Details for article 25 of 28 found articles
| Title: |
Use of electron backscatter diffraction patterns to determine the crystal lattice. Part 2. Offset corrections |
| Author: |
Nolze, Gert Tokarski, Tomasz Rychłowski, Łukasz |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 56 () nr. 2 pages 361-366 |
| Year: |
2023-04-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 25 of 28 found articles
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