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Details for article 34 of 38 found articles
| Title: |
Two-step GISAXS characterization of NiSi2 nanoplates and Ni nanocrystals embedded in a silicon wafer covered with a silica thin film |
| Author: |
da Silva Costa, Daniel Kellermann, Guinther Craievich, Aldo F. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 56 () nr. 1 pages 95-102 |
| Year: |
2023-02-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 34 of 38 found articles
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