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Details for article 9 of 35 found articles
| Title: |
Electron diffraction characterization of nanocrystalline materials using a Rietveld-based approach. Part I. Methodology |
| Author: |
Sinha, Ankur Bortolotti, Mauro Ischia, Gloria Lutterotti, Luca Gialanella, Stefano |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 55 () nr. 4 pages 953-965 |
| Year: |
2022-08-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 35 found articles
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