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Details for article 19 of 37 found articles
| Title: |
Laue X-ray diffraction studies of the structural perfection of Al-doped thermomigration channels in silicon |
| Author: |
Lomov, Andrey A. Punegov, Vasily I. Seredin, Boris M. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 54 () nr. 2 pages 588-596 |
| Year: |
2021-04-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 19 of 37 found articles
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