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Details for article 23 of 26 found articles
| Title: |
X-ray diffraction reveals the amount of strain and homogeneity of extremely bent single nanowires |
| Author: |
Davtyan, Arman Kriegner, Dominik Holý, Václav AlHassan, Ali Lewis, Ryan B. McDermott, Spencer Geelhaar, Lutz Bahrami, Danial Anjum, Taseer Ren, Zhe Richter, Carsten Novikov, Dmitri Müller, Julian Butz, Benjamin Pietsch, Ullrich |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 53 () nr. 5 pages 1310-1320 |
| Year: |
2020-00-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 23 of 26 found articles
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