|
| next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 1 of 31 found articles
| Title: |
Accurate high-resolution single-crystal diffraction data from a Pilatus3 X CdTe detector |
| Author: |
Krause, Lennard Tolborg, Kasper Grønbech, Thomas Bjørn Egede Sugimoto, Kunihisa Iversen, Bo Brummerstedt Overgaard, Jacob |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 53 () nr. 3 pages 635-649 |
| Year: |
2020-06-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 31 found articles
| next >> |