Fast fitting of reflectivity data of growing thin films using neural networks
Titel:
Fast fitting of reflectivity data of growing thin films using neural networks
Auteur:
Greco, Alessandro Starostin, Vladimir Karapanagiotis, Christos Hinderhofer, Alexander Gerlach, Alexander Pithan, Linus Liehr, Sascha Schreiber, Frank Kowarik, Stefan
Verschenen in:
Journal of applied crystallography
Paginering:
Jaargang 52 () nr. 6 pagina's 1342-1347
Jaar:
2019-02-01
Inhoud:
Uitgever:
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England