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                                       Details for article 16 of 35 found articles
 
 
  Effects of annealing parameters on residual stress and piezoelectric performance of ZnO thin films studied by X-ray diffraction and atomic force microscopy
 
 
Title: Effects of annealing parameters on residual stress and piezoelectric performance of ZnO thin films studied by X-ray diffraction and atomic force microscopy
Author: Shen, Jie-Nan
Zeng, Yi-Bo
Xu, Ma-Hui
Zhu, Lin-Hui
Liu, Bao-Lin
Guo, Hang
Appeared in: Journal of applied crystallography
Paging: Volume 52 (2019) nr. 5 pages 951-959
Year: 2019-00-01
Contents:
Publisher: International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 16 of 35 found articles
 
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