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Details for article 4 of 26 found articles
| Title: |
A study of the strain distribution by scanning X-ray diffraction on GaP/Si for III–V monolithic integration on silicon |
| Author: |
Zhou, Ang Ping Wang, Yan Cornet, Charles Léger, Yoan Pédesseau, Laurent Favre-Nicolin, Vincent Chahine, Gilbert André Schülli, Tobias Urs Eymery, Joël Bahri, Mounib Largeau, Ludovic Patriarche, Gilles Durand, Olivier Létoublon, Antoine |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 52 (2019) nr. 4 pages 809-815 |
| Year: |
2019-08-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4 of 26 found articles
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