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Details for article 7 of 26 found articles
| Title: |
Detailed surface analysis of V-defects in GaN films on patterned silicon(111) substrates by metal–organic chemical vapour deposition |
| Author: |
Gao, Jiang-Dong Zhang, Jian-Li Zhu, Xin Wu, Xiao-Ming Mo, Chun-Lan Pan, Shuan Liu, Jun-Lin Jiang, Feng-Yi |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 52 (2019) nr. 3 pages 637-642 |
| Year: |
2019-06-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 26 found articles
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