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Details for article 20 of 28 found articles
| Title: |
Reciprocal space mapping and strain scanning using X-ray diffraction microscopy |
| Author: |
Poulsen, H. F. Cook, P. K. Leemreize, H. Pedersen, A. F. Yildirim, C. Kutsal, M. Jakobsen, A. C. Trujillo, J. X. Ormstrup, J. Detlefs, C. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 51 (2018) nr. 5 pages 1428-1436 |
| Year: |
2018-00-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 20 of 28 found articles
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