Model-free classification of X-ray scattering signals applied to image segmentation
Titel:
Model-free classification of X-ray scattering signals applied to image segmentation
Auteur:
Lutz-Bueno, V. Arboleda, C. Leu, L. Blunt, M. J. Busch, A. Georgiadis, A. Bertier, P. Schmatz, J. Varga, Z. Villanueva-Perez, P. Wang, Z. Lebugle, M. David, C. Stampanoni, M. Diaz, A. Guizar-Sicairos, M. Menzel, A.
Verschenen in:
Journal of applied crystallography
Paginering:
Jaargang 51 (2018) nr. 5 pagina's 1378-1386
Jaar:
2018-00-01
Inhoud:
Uitgever:
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England