|
In situ Bragg coherent X-ray diffraction during tensile testing of an individual Au nanowire |
|
|
|
Title: |
In situ Bragg coherent X-ray diffraction during tensile testing of an individual Au nanowire |
Author: |
Shin, J. Cornelius, T. W. Labat, S. Lauraux, F. Richard, M.-I. Richter, G. Blanchard, N. P. Gianola, D. S. Thomas, O. |
Appeared in: |
Journal of applied crystallography |
Paging: |
Volume 51 (2018) nr. 3 pages 781-788 |
Year: |
2018-06-01 |
Contents: |
|
Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Source file: |
Elektronische Wetenschappelijke Tijdschriften |
|
|
|
|