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Details for article 15 of 37 found articles
| Title: |
Lattice tilt and strain mapped by X-ray scanning nanodiffraction in compositionally graded SiGe/Si microcrystals |
| Author: |
Meduňa, Mojmír Isa, Fabio Jung, Arik Marzegalli, Anna Albani, Marco Isella, Giovanni Zweiacker, Kai Miglio, Leo von Känel, Hans |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 51 (2018) nr. 2 pages 368-385 |
| Year: |
2018-04-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 15 of 37 found articles
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