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Extended model for the reconstruction of periodic multilayers from extreme ultraviolet and X-ray reflectivity data |
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Titel: |
Extended model for the reconstruction of periodic multilayers from extreme ultraviolet and X-ray reflectivity data |
Auteur: |
Svechnikov, Michael Pariev, Dmitry Nechay, Andrey Salashchenko, Nikolay Chkhalo, Nikolay Vainer, Yuly Gaman, Dmitry |
Verschenen in: |
Journal of applied crystallography |
Paginering: |
Jaargang 50 (2017) nr. 5 pagina's 1428-1440 |
Jaar: |
2017-00-01 |
Inhoud: |
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Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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