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Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a two-dimensional energy-dispersive detector |
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Titel: |
Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a two-dimensional energy-dispersive detector |
Auteur: |
Abboud, A. Kirchlechner, C. Keckes, J. Conka Nurdan, T. Send, S. Micha, J. S. Ulrich, O. Hartmann, R. StrĂ¼der, L. Pietsch, U. |
Verschenen in: |
Journal of applied crystallography |
Paginering: |
Jaargang 50 (2017) nr. 3 pagina's 901-908 |
Jaar: |
2017-06-01 |
Inhoud: |
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Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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