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A microcontroller for in situ single-crystal diffraction measurements with a PILATUS-2M detector under an alternating electric field |
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Titel: |
A microcontroller for in situ single-crystal diffraction measurements with a PILATUS-2M detector under an alternating electric field |
Auteur: |
Choe, Hyeokmin Heidbrink, Stefan Ziolkowski, Michael Pietsch, Ullrich Dyadkin, Vadim Gorfman, Semën Chernyshov, Dmitry |
Verschenen in: |
Journal of applied crystallography |
Paginering: |
Jaargang 50 (2017) nr. 3 pagina's 975-977 |
Jaar: |
2017-06-01 |
Inhoud: |
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Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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